Selected Publications
- Process dependence of proton-induced degradation in GaN HEMTs, T Roy, EX Zhang, YS Puzyrev, DM Fleetwood, RD Schrimpf, BK Choi, …, IEEE Transactions on Nuclear Science 57 (6), 3060-3065, 2010
- Experimental characterization of a metal-oxide-semiconductor field-effect transistor-based Coulter counter, M Sridhar, D Xu, Y Kang, AB Hmelo, LC Feldman, D Li, D Li, Journal of Applied physics 103 (10), 104701, 2008
- Wide-spectrum, ultrasensitive fluidic sensors with amplification from both fluidic circuits and metal oxide semiconductor field effect transistors, D Xu, Y Kang, M Sridhar, AB Hmelo, LC Feldman, D Li, D Li, Applied physics letters 91 (1), 013901, 2007
- Equilibrium of liquid drops under the effects of rotation and acoustic flattening: results from USML-2 experiments in Space, CP Lee, AV Anilkumar, AB Hmelo, TG Wang, Journal of Fluid Mechanics 354, 43-67, 1998
- Er-doped ZnO films grown by pulsed e-beam deposition, Z Pan, SH Morgan, A Ueda, R Aga Jr, A Steigerwald, AB Hmelo, R Mu, Journal of Physics: Condensed Matter 19 (26), 266216, 2007
- Semiconductor point defect concentration profiles measured using coherent acoustic phonon waves, A Steigerwald, Y Xu, J Qi, J Gregory, X Liu, JK Furdyna, K Varga, …, Applied Physics Letters 94 (11), 111910, 2009
- The Synchrotron Topography Project (STP) at the national Synchrotron light source, JC Bilello, H Chen, AB Hmelo, JM Liu, HK Birnbaum, PJ Herley, …, Nuclear Instruments and Methods in Physics Research 215 (1-2), 291-297, 1983
- Synchrotron X-ray fractography: A novel technique for fracture-surface analysis, AB Hmelo, JC Bilello, ST Davies, DK Bowen, Materials Letters 2 (1), 6-11, 1983
- The effect of enhanced gravity levels on microstructural development in Pb-50 wt pct Sn alloys during controlled directional solidification, CC Battalle, RN Grugel, AB Hmelo, TG Wang, Metallurgical and Materials Transactions A 25 (4), 865-870, 1994
- CdSSe nanocrystals with induced chemical composition gradients, MA Harrison, A Ng, AB Hmelo, SJ Rosenthal, Israel Journal of Chemistry 52 (11‐12), 1063-1072, 2012
- Determination of optical damage cross-sections and volumes surrounding ion bombardment tracks in GaAs using coherent acoustic phonon spectroscopy, A Steigerwald, AB Hmelo, K Varga, LC Feldman, N Tolk, Journal of Applied Physics 112 (1), 013514, 2012
- Emittance measurements of electron beams from diamond field emitter arrays, JD Jarvis, BK Choi, AB Hmelo, B Ivanov, CA Brau, Journal of Vacuum Science & Technology B, Nanotechnology andMicroelectronics: Materials, Processing, Measurement, and Phenomena, 30, 042201, 2012
- Profiling and imaging ion mobility-mass spectrometry analysis of cholesterol and 7-dehydrocholesterol in cells via sputtered silver MALDI, L Xu, M Kliman, JG Forsythe, Z Korade, AB Hmelo, NA Porter, JA McLean, Journal of The American Society for Mass Spectrometry 26 (6), 924-933, 2015
- Growth of solid and hollow gold particles through the thermal annealing of nanoscale patterned thin films, J Lin, W He, S Vilayurganapathy, SJ Peppernick, B Wang, S Palepu, …, ACS applied materials & interfaces 5 (22), 11590-11596, 2013
- Ion implantation induced modification of optical properties in single-crystal diamond studied by coherent acoustic phonon spectroscopy, J Gregory, A Steigerwald, H Takahashi, A Hmelo, N Tolk, Applied Physics Letters 101 (18), 181904, 2012
- High fluence 1.8 MeV proton irradiation effects on n-type MOS capacitors, R Arinero, EX Zhang, N Rezzak, RD Schrimpf, DM Fleetwood, BK Choi, …, Microelectronics Reliability 51 (12), 2093-2096, 2011
- Core centering of immiscible compound drops in capillary oscillations: Experimental observations, AV Anilkumar, AB Hmelo, TG Wang, Journal of colloid and interface science 242 (2), 465-469, 2001
- Fabrication and evaluation of 2D confined nanochannels, JP Alarie, AB Hmelo, SC Jacobsoni, AP Baddorf, L Feldman, JM Ramsey, Micro Total Analysis Systems 2003, 9-12, 2003
- Radiation effects on the photoluminescence of rare-earth doped pyrochlore powders, SL Weeden-Wright, SL Gollub, R Harl, AB Hmelo, DM Fleetwood, …, IEEE Transactions on Nuclear Science 60 (4), 2444-2449, 2013
- Using synchrotron X-ray microtomography to detect defects, JO Milewski, AB Hmelo, JH Dunsmuir, SR Ferguson, KL D’Amico, Welding Journal (Miami);(United States) 73 (2), 1994