{"id":3741,"date":"2022-05-16T08:37:26","date_gmt":"2022-05-16T13:37:26","guid":{"rendered":"https:\/\/my.vanderbilt.edu\/vinsenews\/?p=3741"},"modified":"2022-07-05T09:23:26","modified_gmt":"2022-07-05T14:23:26","slug":"dissertation-defense-kan-li-interdisciplinary-materials-science","status":"publish","type":"post","link":"https:\/\/my.vanderbilt.edu\/vinsenews\/2022\/05\/dissertation-defense-kan-li-interdisciplinary-materials-science\/","title":{"rendered":"Dissertation Defense: Kan Li, Interdisciplinary Materials Science"},"content":{"rendered":"<p><a href=\"https:\/\/cdn.vanderbilt.edu\/t2-my\/my-prd\/wp-content\/uploads\/sites\/1669\/2022\/05\/Kan.jpg\"><img loading=\"lazy\" decoding=\"async\" class=\"size-full wp-image-3742 alignright\" src=\"https:\/\/cdn.vanderbilt.edu\/t2-my\/my-prd\/wp-content\/uploads\/sites\/1669\/2022\/05\/Kan.jpg\" alt=\"Kan\" width=\"240\" height=\"240\" srcset=\"https:\/\/cdn.vanderbilt.edu\/t2-my\/my-prd\/wp-content\/uploads\/sites\/1669\/2022\/05\/Kan.jpg 240w, https:\/\/cdn.vanderbilt.edu\/t2-my\/my-prd\/wp-content\/uploads\/sites\/1669\/2022\/05\/Kan-150x150.jpg 150w\" sizes=\"auto, (max-width: 240px) 100vw, 240px\" \/><\/a>DISSERTATION DEFENSE<\/p>\n<p>Kan Li, Interdisciplinary Materials Science<br \/>\n*under the direction of Dr. Ronald Schrimpf<\/p>\n<p>\u201c<em>Laser-induced single event effects, total-ionizing-dose effects, and low-frequency noise in advanced FinFETs<\/em>\u201d<\/p>\n<p>Tuesday, May 24, 2022 | 12:00 | <a href=\"https:\/\/vanderbilt.zoom.us\/j\/95478035392\">Zoom<\/a><\/p>\n<p>In this dissertation, radiation effects and low-frequency noise are studied in advanced FinFETs. Firstly, we evaluate the single-event effects on devices with the promising InGaAs channel material and highly-scaled fin widths (sub-10 nm) through pulsed-laser measurements. Higher peak currents and greater charge collection are observed in wider fin devices as a result of larger active volumes. The amplitudes of the SETs and the collected charge also increase with <em>V<sub>ds<\/sub><\/em> due to the enhancement of the electric field along the channel; the transient tail increases as the overdrive voltage increases. Charge collection is influenced strongly by the shunt effect and parasitic bipolar effect. Secondly, we investigate total-ionizing-dose (TID) response and low-frequency noise in bulk Si FinFETs with\/without through-silicon vias (TSVs) integration. TSVs negligibly impact charge trapping properties of gate\/field oxides during TID, or the 1\/<em>f<\/em> noise results, and <em>n<\/em>MOS and <em>p<\/em>MOS devices show opposite border-trap energy distribution trends at room temperature. Temperature dependence of 1\/<em>f<\/em> noise is also explored in both device types with SiO<sub>2<\/sub>\/HfO<sub>2<\/sub> gate dielectrics. The <em>n<\/em>MOSFET 1\/<em>f<\/em> noise generally decreases as temperature increases, with three prominent individual defect-related peaks detected, while <em>p<\/em>MOSFET 1\/<em>f<\/em> noise generally increases with increasing temperature with no peaks observed. The gate-voltage dependence of noise at different temperatures shows a qualitatively consistent result with that inferred from Dutta-Horn analysis of the temperature dependence of the noise.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>DISSERTATION DEFENSE Kan Li, Interdisciplinary Materials Science *under the direction of Dr. Ronald Schrimpf \u201cLaser-induced single event effects, total-ionizing-dose effects, and low-frequency noise in advanced FinFETs\u201d Tuesday, May 24, 2022 | 12:00 | Zoom In this dissertation, radiation effects and low-frequency noise are studied in advanced FinFETs. Firstly, we evaluate the single-event effects on devices&#8230;<\/p>\n","protected":false},"author":3411,"featured_media":3742,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[13,1],"tags":[34,267,57,268,18],"class_list":["post-3741","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-events","category-news","tag-ims","tag-kan-li","tag-materials-science","tag-ronald-schrimpf","tag-vinse-news"],"_links":{"self":[{"href":"https:\/\/my.vanderbilt.edu\/vinsenews\/wp-json\/wp\/v2\/posts\/3741","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/my.vanderbilt.edu\/vinsenews\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/my.vanderbilt.edu\/vinsenews\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/my.vanderbilt.edu\/vinsenews\/wp-json\/wp\/v2\/users\/3411"}],"replies":[{"embeddable":true,"href":"https:\/\/my.vanderbilt.edu\/vinsenews\/wp-json\/wp\/v2\/comments?post=3741"}],"version-history":[{"count":1,"href":"https:\/\/my.vanderbilt.edu\/vinsenews\/wp-json\/wp\/v2\/posts\/3741\/revisions"}],"predecessor-version":[{"id":3743,"href":"https:\/\/my.vanderbilt.edu\/vinsenews\/wp-json\/wp\/v2\/posts\/3741\/revisions\/3743"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/my.vanderbilt.edu\/vinsenews\/wp-json\/wp\/v2\/media\/3742"}],"wp:attachment":[{"href":"https:\/\/my.vanderbilt.edu\/vinsenews\/wp-json\/wp\/v2\/media?parent=3741"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/my.vanderbilt.edu\/vinsenews\/wp-json\/wp\/v2\/categories?post=3741"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/my.vanderbilt.edu\/vinsenews\/wp-json\/wp\/v2\/tags?post=3741"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}