{"id":3,"date":"2019-08-21T14:34:08","date_gmt":"2019-08-21T14:34:08","guid":{"rendered":"https:\/\/my.vanderbilt.edu\/warrenkm\/homepage\/"},"modified":"2019-08-21T09:46:12","modified_gmt":"2019-08-21T14:46:12","slug":"homepage","status":"publish","type":"page","link":"https:\/\/my.vanderbilt.edu\/warrenkm\/","title":{"rendered":"Home Page"},"content":{"rendered":"<h1>Education<\/h1>\n<h2>Ph.D. Electrical Engineering, Vanderbilt University, Nashville, TN. 2010<\/h2>\n<p>Dissertation Title: Sensitive Volume Models For Single Event Upset Analysis and Rate Prediction for Space, Atmospheric, and Terrestrial Radiation Environments<\/p>\n<h2>M.S. Electrical Engineering, Vanderbilt University, Nashville, TN. 1999<\/h2>\n<p>Thesis Title: The Influence of SOI-MOSFET Geometry on Predicted Single Event Cross Sections<\/p>\n<h2>M.S. Chemistry, Vanderbilt University, Nashville, TN. 1997<\/h2>\n<p>Thesis Title: Measurement of b and n<sub>2<\/sub> for Platinum\/silica-xerogel Nanocomposites and Preparation of Gold Quantum Dots on Sodium Bicarbonate<\/p>\n<h2>B.S. Chemistry, Tennessee Technological University, Cookeville, TN.1994<\/h2>\n<p>Emphasis: Biochemistry, Minor: Mathematics, Biology<\/p>\n<h1>Professional Experience<\/h1>\n<h2>Vanderbilt University Institute for Space and Defense Electronics 2003-Current<\/h2>\n<ul>\n<li>Developed novel methodologies for predicting single event upset rates in hardened technologies through advanced simulation techniques using physics based radiation transport software (e.g., Geant4, MRED)<\/li>\n<li>Served as Principle Investigator for the development and migration of in-house developed radiation transport tools for government and commercial partners<\/li>\n<li>Designed, developed, and integrated space environment modeling modules and tools including those for the transport of charged particles through the Earth\u2019s magnetosphere using Geant4<\/li>\n<li>Established new laboratories and design facilities for the development of electronics and systems for spaceflight<\/li>\n<li>Served as lead systems engineer and project technical manager for payload designs on CubeSat programs<\/li>\n<li>Served as lead for multiple heavy ion, proton, and dose-rate testing campaigns<\/li>\n<li>Managed contracts relating to the analysis of electronic components and semiconductor processes for use in high reliability applications in space radiation environments<\/li>\n<li>Performed design and layout of test chips and developed test plans for weapons radiation environment applications<\/li>\n<li>Performed extensive design analysis and simulation of high reliability electronics for medical implantable devices and the effects of terrestrial and diagnostic radiation sources on their failure rates<\/li>\n<li>Managed junior engineers and students in meeting contract goals related to the modeling and simulation of radiation effects on electronics<\/li>\n<li>Wrote and participated in the writing of proposals related to group research activities<\/li>\n<\/ul>\n<h2>The Johns Hopkins University Applied Physics Laboratory 2000-2003<\/h2>\n<ul>\n<li>Radiation effects engineer for MESSENGER and CONTOUR spacecraft<\/li>\n<li>Performed single event effect testing of candidate spacecraft electronics at Brookhaven National Laboratories and the Texas A&amp;M Cyclotron Facility as well as total ionizing dose testing using an in-house <sup>60<\/sup>Co source<\/li>\n<li>Developed procedures and performed up-screening of commercial electronics for spaceflight<\/li>\n<\/ul>\n<h2>Raytheon STX 1999-2000<\/h2>\n<ul>\n<li>Radiation effects on electronics engineer for manned space-flight systems including the International Space Station at Marshall Space Flight Center<\/li>\n<\/ul>\n<h1>Professional Activities<\/h1>\n<ul>\n<li>2000-present: Reviewer for the Nuclear Plasma Society\u2019s IEEE Transactions on Nuclear Science<\/li>\n<li>2015: Reviewer for Nuclear Instruments and Methods in Physics Research, B<\/li>\n<li>2013 International Reliability Physics Symposium committee member<\/li>\n<li>2012 IEEE Nuclear and Space Radiation Effects Conference Short Course presenter<\/li>\n<li>2011 International Reliability Physics Symposium committee member<\/li>\n<li>2015, 2005 Nuclear and Space Radiation Effects Technical Session Chairman<\/li>\n<\/ul>\n<h1>Awards<\/h1>\n<ul>\n<li>2017 HEART Conference Best Paper award<\/li>\n<li>2015 IEEE Nuclear and Space Radiation Effects Conference Outstanding Conference Paper Award<\/li>\n<li>2007 IEEE Nuclear and Space Radiation Effects Conference Outstanding Conference Paper Award<\/li>\n<\/ul>\n<h1>Peer Reviewed Publications<\/h1>\n<ul>\n<li>P. Wang, A.L. Sternberg, B.D. Sierawski, E. Zhang, <strong>K.M. Warren<\/strong>, A.M. Tonigan, R.M. Brewer, N.A. Dodds, G. Vizkelethy, S.L. Jordan, D.M. Fleetwood, R.A. Reed, R.D. Schrimpf, \u201cSingle Event Latchup Sensitive Volume Model for a 180-nm SRAM Test Structure,\u201d Submitted for publication and under review, 2019 IEEE Trans. Nucl. Sci.<\/li>\n<li>G.D. Poe, J.S. Kappila, D.R. Ball, <strong>K.M. Warren<\/strong>, B.L. Bhuva, T.D. Haeffner, L.W. Massengill, \u201cA Radiation-Tolerant D Flip-Flop Designed for Low-Voltage Applications,\u201d Submitted for publication and under review, 2019 IEEE Trans. Nucl. Sci.<\/li>\n<li>J.D. Black, J.A. Dame, D.A. Black, P.E. Dodd, M.R. Shaneyfelt, J. Teife, J.G. Salas, R. Steinbach, M. Davis, R.A. Reed, R.A. Weller, J.M. Trippe, <strong>K.M. Warren<\/strong>, A.M. Tonigan, R.D. Schrimpf, R.S. Marquez, \u201cUsing MRED to Screen Multiple-Node Charge-Collection Mitigated SOI Layouts,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 66, no. 1, pp. 233-239. Jan. 2019.<\/li>\n<li><strong>K.M. Warren<\/strong>, J.S. Kauppila, R.A. Weller, M.H. Mendenhall, R.A. Reed, R.D. Schrimpf, A.L. Amort, M. Cabanas-Holmen, and L.W. Massengill, \u201cAnalyzing Single Event Effects with Monte Carlo Radiation Transport and Electronic Design Automation Tools,\u201d Journal of Radiation Effects, Research, and Engineering, vol. 36, no. 1, April 2018.<\/li>\n<li>J.M. Trippe, R.A. Reed, R.A. Austin, B.D. Sierawski, L.W. Massengill, R.A. Weller, <strong>K.M. Warren<\/strong>, R.D. Schrimpf, B. Narasimham, B. Bartz, and D. Reed, \u201cPredicting Muon-Induced SEU Rates for a 28-nm SRAM Using Protons and Heavy Ions to Calibrate the Sensitive Volume Model,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 65, no. 2, pp. 712-718, Dec 2017.<\/li>\n<li>M. Hamlyn, P. L. Hower, <strong>K.M. Warren<\/strong> and R. C. Baumann, \u201cTransmission Line Pulse Test Method for Estimating SEB Performance of n-Channel Lateral DMOS Power Transistors,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 65, No. 1, pp. 249-255, Dec. 2017.<\/li>\n<li>R.C. Harrington, J.S. Kauppila, <strong>K.M. Warren<\/strong>, Y.P. Chen, J.A. Maharrey, T.D. Haeffner, T.D. Loveless, B.L. Bhuva, M. Bounasser, K. Lilja, and L.W. Massengill, \u201cEstimating Single-Event Logic Cross Sections in Advanced Technologies,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 64, no. 8, pp. 2115-2121, Aug. 2017.<\/li>\n<li>B.D. Sierawski, K.M. Warren, A.L. Sternberg, R.A. Austin, J.M. Trippe, M.W. McCurdy, R.A. Reed, R.A. Weller, M.L. Alles, R.D. Schrimpf, L.W. Massengill; D.M. Fleetwood, A. Monterio, G.W. Buxton, J.C. Brandenburg, W.B. Fisher, and R. Davis, \u201cCubeSats and Crowd-Sourced Monitoring for Single Event Effects Hardness Assurance,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 64, no. 1, pp. 293-300, Jan. 2017.<\/li>\n<li>C.N. Arutt, <strong>K.M. Warren<\/strong>, R.D. Schrimpf, R.A. Weller, J.S. Kauppila, J.D. Rowe, A.L. Sternberg, R.A. Reed, D.R. Ball, and D.M. Fleetwood, &#8220;Proton Irradiation as a Screen for Displacement-Damage Sensitivity in Bipolar Junction Transistors,&#8221; <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 62, no. 6, pp. 2498-2504. Dec. 2015.<\/li>\n<li>N.A. Dodds, M.J. Martinez, P.E. Dodd, M.R. Shaneyfelt, F.W. Sexton, J.D. Black, D.S. Lee, S.E. Swanson, B.L. Bhuva, <strong>K.M. Warren<\/strong>, R.A. Reed, J. Trippe, B.D. Sierawski, R.A. Weller, N. Mahatme, N.J. Gaspard, T. Assis, R. Austin, S.L. Weeden-Wright, L.W. Massengill, G. Swift, M. Wirthlin, M. Cannon, R. Liu, L. Chen, A.T. Kelly, P.W. Marshall, M. Trinczek, E.W. Blackmore, S.-J. Wen, R. Wong, B. Narasimham, J.A. Pellish, and H. Puchner, &#8220;The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate,&#8221; <em>IEEE Trans. Nucl. Sci<\/em>., vol. 62, no. 6, pp. 2440-2451. Dec. 2015.<\/li>\n<li>R.A. Reed, R.A. Weller, M.H. Mendenhall, D.M. Fleetwood, <strong>K.M. Warren<\/strong>, B.D. Sierawski, M.P. King, R.D. Schrimpf, and E.C. Auden, &#8220;Physical Processes and Applications of the Monte Carlo Radiative Energy Deposition (MRED) Code,&#8221;<em> IEEE Trans. Nucl. Sci.<\/em>, vol. 62, no. 4, pp. 1441-146, Aug. 2015.<\/li>\n<li>J.D. Black, P.E. Dodd, and <strong>K.M. Warren<\/strong>, &#8220;Physics of Multiple-Node Charge Collection and Impacts on Single-Event Characterization and Soft Error Rate Prediction,&#8221;<em> IEEE Trans. Nucl. Sci.<\/em>, vol. 60, no. 3, pp. 1836-1851. Jun. 2013.<\/li>\n<li>J.H. Adams, A.F. Barghouty, M.H. Mendenhall, R.A. Reed, B.D. Sierawski, <strong>K.M. Warren<\/strong>, J.W. Watts, and R.A. Weller, &#8220;CR\u00c8ME: The 2011 Revision of the Cosmic Ray Effects on Micro-Electronics Code,&#8221; <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 59, no. 6, pp. 3141-3147. Dec. 2012.<\/li>\n<li>W.G. Bennett, R.D. Schrimpf, N.C. Hooten, R.A. Reed, J.S. Kauppila, R.A. Weller, <strong>K.M. Warren<\/strong>, and M.H. Mendenhall, &#8220;Efficient Method for Estimating the Characteristics of Radiation-Induced Current Transients,&#8221; <em>IEEE Trans. Nucl. Sci<\/em>., vol. 59, no. 6, pp. 2704-2709. Dec. 2012.<\/li>\n<li>M.A. Clemens, B.D. Sierawski, <strong>K.M. Warren<\/strong>, M.H. Mendenhall, N.A. Dodds, R.A. Weller, R.A. Reed, P.E. Dodd, M.R. Shaneyfelt, J.R. Schwank, S.A. Wender, and R.C. Baumann, &#8220;The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets,&#8221; <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 58, no. 6, pp. 2591-2598. Dec. 2011.<\/li>\n<li>L. Artola, G. Hubert, <strong>K.M. Warren<\/strong>, M. Gaillardin, R.D. Schrimpf, R.A. Reed, R.A. Weller, J.R. Ahlbin, P. Paillet, M. Raise, S. Girard, S. Duzellier, L.W. Massengill, and F. Bezerra, &#8220;SEU Prediction From SET Modeling Using Multi-Node Collection in Bulk Transistors and SRAMs Down to the 65nm Technology Node,&#8221; <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 58, no. 3, pp. 1338-1346. Jun. 2011.<\/li>\n<li>N.F. Haddad, A.T. Kelly, R.K. Lawrence, Bin Li, J.C. Rodgers, J.F. Ross, <strong>K.M. Warren<\/strong>, R.A. Weller, M.H. Mendenhall, and R.A. Reed, &#8220;Incremental Enhancement of SEU Hardened 90nm CMOS Memory Cell,&#8221; <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 58, no. 3, pp. 975-980. Jun. 2011.<\/li>\n<li>B. Narasimham, J.K. Wang, M. Buer, R. Gorti, K. Chandrasekharan, <strong>K.M. Warren<\/strong>, B.D. Sierawski, R.D. Schrimpf, R. A. Reed, and R.A. Weller, \u201cContribution of Control Logic Upsets and Multi-Node Charge Collection to Flip-Flop SEU Cross-Section in 40-nm CMOS,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 57, no. 6. pp. 3176-3182. Dec. 2010.<\/li>\n<li>T.D. Loveless, M.L. Alles, D.R. Ball, <strong>K.M. Warren<\/strong>, and L.W. Massengill, &#8220;Parametric Variability Affecting 45nm SOI SRAM Single Event Upset Cross-Section,&#8221; <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 57, no. 6, pp. 3228-3233. Dec. 2010.<\/li>\n<li>R.A. Weller, M.H. Mendenhall, R.A. Reed, R.D. Schrimpf, <strong>K.M. Warren<\/strong>, B.D. Sierawski, and L.W. Massengill, \u201cMonte Carlo Simulation of Single Event Effects,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 57, no.4, pp. 1726-1746. Aug. 2010.<\/li>\n<li><strong>K.M. Warren<\/strong>, A.L. Sternberg, J.D. Black, R.A. Weller, R. A. Reed, M.H. Mendenhall, R.D. Schrimpf, and L.W. Massengill, \u201cHeavy Ion Testing and Single Event Upset Rate Prediction Considerations for a DICE Flip-Flop,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 56, no. 6, pp. 3130-3137. Dec. 2009.<\/li>\n<li>R.A. Weller, R.A. Reed,<strong> K.M. Warren<\/strong>, M.H. Mendenhall, B.D. Sierawski, R.D. Schrimpf, and L.W. Massengill, \u201cGeneral Framework for Single Event Effects Rate Prediction in Microelectronics,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 56, no. 6, pp. 3098-3108. Dec. 2009.<\/li>\n<li>B.D. Sierawski, J.A. Pellish, R.A. Reed, R.D. Schrimpf,<strong> K.M. Warren<\/strong>, R.A. Weller, M.H. Mendenhall, J.D. Black, A.D. Tipton, M.A. Xapsos, R.C. Baumann, X. Deng, M.J. Campola, Friendlich, H.S. Kim, A.M. Phan, and C.M. Seidleck, \u201cImpact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions,\u201d<em> IEEE Trans. Nucl. Sci.<\/em>, vol. 56 no. 6, pp. 3085-3092. Dec. 2009.<\/li>\n<li>R.A. Weller, R.A Reed,<strong> K.M. Warren<\/strong>, M.H. Mendenhall, B.D. Sierawski, R.D. Schrimpf, and L.W. Massengill, \u201cGeneral Framework for Single Event Effects Rate Prediction in Microelectronics,\u201d<em> IEEE Trans. Nucl. Sci<\/em>., vol. 56, no. 6, pp. 3098-3108. Dec. 2009.<\/li>\n<li><strong>K.M. Warren<\/strong>, A.L. Sternberg, R.A. Weller, M. P. Baze, L.W. Massengill, R.A. Reed, M.H. Mendenhall, and R.D. Schrimpf, \u201cIntegrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 55, no. 6, pp. 2886-2894. Dec. 2008.<\/li>\n<li>J.D. Black, D.R. Ball II, <strong>K.M. Warren<\/strong>, R.D. Schrimpf, R.A. Reed, D.M. Fleetwood, W.H. Robinson, A.D. Tipton, D.A. Black, P.E. Dodd, and N F. Haddad, \u201cCharacterizing SRAM Single Event Upset in Terms of Single and Double Node Charge Collection ,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 55, no. 6, pp. 2943-2947. Dec. 2008.<\/li>\n<li>R.D. Schrimpf, <strong>K.M. Warren<\/strong>, D.R. Ball, R.A. Weller, R.A. Reed, D.M. Fleetwood, L.W. Massengill, M.H. Mendenhall, S.N. Rashkeev, S.T. Pantelides, and M.L. Alles, \u201cMulti-Scale Simulation of Radiation Effects in Electronic Devices,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 55, no. 4, pp. 1891-1902. Aug. 2008.<\/li>\n<li>M.J. Gadlage, R.D. Schrimpf, B. Narasimham, J.A. Pellish, <strong>K.M. Warren<\/strong>, R.A. Reed, B.L. Bhuva, L.W. Massengill, and X. Zhu, \u201cAssessing Alpha Particle-Induced Single Event Transient Vulnerability in a 90-nm CMOS Technology,\u201d <em>IEEE Electron Device Let.<\/em>, vol. 29, no. 6, pp. 638-640. Jun. 2008.<\/li>\n<li><strong>K.M. Warren<\/strong>, B.D. Sierawski, R.A. Reed, R.A. Weller, C. Carmichael, A. Lesea, M.H. Mendenhall, P.E. Dodd, R.D. Schrimpf, L.W. Massengill, T. Hoang, H. Wan, JL Jong, R. Padovani, and J. Fabula, \u201cMonte-Carlo Based On- Orbit Single Event Upset Rate Prediction for a Radiation Hardened by Design Latch,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 54, no. 6. pp. 2419-2425. Dec. 2007.<\/li>\n<li>P.E. Dodd, J.R. Schwank, M.R. Shaneyfelt, J.A. Felix, P. Paillet, V. Ferlet-Cavrois, J. Baggio, R.A. Reed, <strong>K.M. Warren, <\/strong>R.A. Weller, R.D. Schrimpf, G.L. Hash, S.M. Dalton, K. Hirose, and H. Saito, \u201cImpact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 54, no. 6, pp. 2303-2311. Dec. 2007.<\/li>\n<li>R.A. Reed, R.A. Weller, M.H. Mendenhall, J.-M Lauenstein,<strong> K.M. Warren<\/strong>, J.A. Pellish, R.D. Schrimpf, B.D. Sierawski, L.W. Massengill, P.E. Dodd, M.R. Shaneyfelt, J.A. Felix, J.R. Schwank, N.F. Haddad, R.K. Lawrence, J.H. Bowman, and R. Conde, \u201cImpact of Ion Energy and Species on Single Event Effects Analysis,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 54, no. 6, pp. 2312-2321. Dec. 2007.<\/li>\n<li>J.A. Pellish, R.A. Reed, A.K. Sutton, R.A. Weller, M.A. Carts, P.W. Marshall, C.J. Marshall, R. Krithivasan, J.D. Cressler, M.H. Mendenhall, R.D. Schrimpf, <strong>K.M. Warren<\/strong>, B.D. Sierawski, and G.F. Niu, \u201cA Generalized SiGe HBT Single-Event Effects Model for On-Orbit Event Rate Calculations,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 54, no. 6. pp. 2322-2329. Dec. 2007.<\/li>\n<li>D. McMorrow, W.T. Lotshaw, J.S. Melinger, S. Buchner, J.D. Davis, R.K. Lawrence, D. Haddad, J.H. Bowman, R.D. Brown, D. Carlton, J Pena, J. Vasquez, <strong>K.M. Warren<\/strong>, and L.W. Massengill, \u201cSingle-Event Upset in Flip- Chip SRAM Induced by Through-Wafer, Two-Photon Absorption,\u201d<em> IEEE Trans. Nucl. Sci.<\/em>, vol. 52, no. 6, pp. 2421-2425. Dec. 2007.<\/li>\n<li><strong>K.M. Warren<\/strong>, R.A. Weller, B.D. Sierawski, R.A. Reed, M.H. Mendenhall, R.D. Schrimpf, L.W. Massengill, M. Porter, J. Wilkinson, K.A. LaBel, and J. Adams, \u201cApplication of RADSAFE to Model Single Event Upset Response of a 0.25 um CMOS SRAM,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 54, no. 4, pp. 898-903. Aug. 2007.<\/li>\n<li>B.D. Olson, O.A. Amusan, S. Dasgupta, L.W. Massengill, A.F. Witulski, B.L. Bhuva, M.L. Alles, <strong>K.M. Warren<\/strong>, and D.R. Ball, \u201cAnalysis of Parasitic PNP Bipolar Transistor Mitigation Using Well Contacts in 130 nm and 90 nm CMOS Technology,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 54, no. 4, pp. 894-897. Aug. 2007.<\/li>\n<li><strong>K.M. Warren<\/strong>, B.D. Sierawski, R.A. Weller, R.A. Reed, M.H. Mendenhall, J.A. Pellish, R.D. Schrimpf, L.W. Masengill, M.E. Porter, and J.W. Wilkinson, \u201cPredicting Thermal Neutron-Induced Soft Errors in Static Memories Using TCAD and Physics-Based Monte Carlo Simulation Tools,\u201d <em>Electron Device Let.<\/em>, vol. 28, no. 2, pp. 180-182. Feb. 2007.<\/li>\n<li>R.A. Reed, R.A. Weller, R. D. Schrimpf, M.H. Mendenhall, <strong>K.M. Warren<\/strong>, and L.W. Massengill, \u201cImplications of Nuclear Reactions for Single Event Effects Test Methods and Analysis,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 53, no. 6, pp. 3356-3362. Dec. 2006.<\/li>\n<li>D.R. Ball, <strong>K.M. Warren<\/strong>, R.A. Weller, R.A. Reed, A. Kobayashi, J.A. Pellish, M.H. Mendenhall, C.L. Howe, L.W. Massengill, R.D. Schrimpf, and N.F. Haddad, \u201cSimulating Nuclear Events in a TCAD Model of a High-Density SEU Hardened SRAM Technology,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 53, no. 4, pp. 1794-1798. Aug. 2006.<\/li>\n<li><strong>K.M. Warren<\/strong>, R.A. Weller, M.H. Mendenhall, R.A. Reed, D.R. Ball, C.L. Howe, B.D. Olson, M.L. Alles, L.W. Massengill, R.D. Schrimpf, N.F. Haddad, S.E. Doyle, D. McMorrow, J.S. Melinger, and W.T. Lotshaw, \u201cThe Contribution of Nuclear Reactions to Heavy Ion Single Event Upset Cross-section Measurements in a High-density SEU Hardened SRAM,\u201d<em> IEEE Trans. Nucl. Sci.,<\/em> vol. 52, no. 6, pp. 2125-2131. Dec. 2005.<\/li>\n<li>C.L. Howe, R.A. Weller, R.A. Reed, M.H. Mendenhall, R.D. Schrimpf, <strong>K.M. Warren<\/strong>, D.R. Ball, L.W. Massengill, K.A. LaBel, J.W. Howard, and N.F. Haddad, \u201cRole of Heavy-ion Nuclear Reactions in Determining On-orbit Single Event Error Rates,\u201d<em> IEEE Trans. Nucl. Sci.,<\/em> vol. 52, no. 6, pp. 2182-2188. Dec. 2005.<\/li>\n<li>B.D. Olson, D.R. Ball, <strong>K.M. Warren<\/strong>, L.W. Massengill, N.F. Haddad, S.E. Doyle, and D. McMorrow, \u201cSimultaneous Single Event Charge Sharing and Parasitic Bipolar Conduction in a Highly-Scaled SRAM Design,\u201d <em>IEEE Trans. Nucl. Sci.,<\/em> vol. 52, no. 6, pp. 2132-2136. Dec. 2005.<\/li>\n<li>A.S. Kobayashi, D.R. Ball, <strong>K.M. Warren<\/strong>, R.A. Reed, M.H. Mendenhall, R.D. Schrimpf, and R.A. Weller, \u201cThe Effect of Metallization Layers on Single Event Susceptibility,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 52, no. 6, pp. 2189-2193. Dec. 2005.<\/li>\n<li><strong>K.M. Warren<\/strong>, D. Roth, J. Kinnison, and R. Pappalardo, \u201cSingle Event Burnout of NPN Bipolar Junction Transistors in Hybrid DC\/DC Converters.\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 49, no. 6, pp. 3097-3099. Dec. 2002.<\/li>\n<li><strong>K.M. Warren<\/strong>, D. Roth, J. Kinnison, and R. Pappalardo, \u201cSingle Event Testing of DC\/DC Converters for Space Flight.\u201d IEEE NSREC Data Workshop, 2002. p 106.<\/li>\n<li><strong>K.M. Warren<\/strong>, D. Roth, J. Kinnison, and B. Carkuff, \u201cSingle Event Latchup and Total Dose Testing of Candidate Spacecraft Components.\u201d IEEE NSREC Data Workshop, 2001. p 100.<\/li>\n<li><strong>K.M. Warren<\/strong>, \u201cThe Influence of SOI-MOSFET Geometry on Predicted Single Event Cross Sections\u201d M.S. Thesis, Dept. Elec. Eng., Vanderbilt Univ., Nashville, TN. 1999.<\/li>\n<li><strong>K.M. Warren<\/strong>, L.W. Massengill, R.D. Schrimpf, and H. Barnaby, \u201cAnalysis of the Influence of MOS Device Geometry on Predicted SEU Cross Sections,\u201d <em>IEEE Trans. Nucl. Sci.<\/em>, vol. 46, no. 6, pp. 1363-1369. Dec. 1998.<\/li>\n<\/ul>\n<h1>Conference Proceedings<\/h1>\n<ul>\n<li>J.D. Black, D.A. Black, P.E. Dodd, M.R. Shaneyfelt, R.N. Nowlin, J.M. Trippe, R.A. Reed, R.A. Weller, <strong>K.M. Warren<\/strong>, A.M. Tonigan, R.D. Schrimpf, \u201cHeavy Ion, Neutron, and Proton Simulation of Sandia National Laboratories\u2019 CMOS7 SOI Sequential Circuits,\u201d 2019 Hardened Electronics and Radiation Technology (HEART) Conference, San Diego, CA.<\/li>\n<li>B.D. Sierawski, R.A. Austin, J.M. Trippe , K.M. Warren, A.L. Sternberg, R.A. Reed, R.A. Weller, \u201cThe RadFxSat Mission to Study Radiation Effects on Advanced Nanoelectronics,\u201d 2019 Small Satellite Conference, Logan, UT. Aug. 2019.<\/li>\n<li>M.L. Breeding, R.A. Reed, <strong>K.M. Warren<\/strong>, M.L. Alles, \u201cExploration of the Impact of Physical Integration Schemes on Soft Errors in 3D ICs Using Monte Carlo Simulation,\u201d 2019 IEEE International Reliability Physics Symposium (IRPS). Monterey, CA, Mar. 2019.<\/li>\n<li><strong>K.M. Warren<\/strong>, M.L. Alles, P. Fraznon, S. Iyer, R. Patti, S. La Lumondiere, G. Hiblot, S. Chermay, \u201cThe Impact of Materials on the Radiation Response of Three-Dimensional Integrated Circuits,\u201d 2019 GOMACTech Conference, San Diego, CA. Mar. 2019.<\/li>\n<li>G.D. Poe, J.S. Kauppila, D.R. Ball, <strong>K. M. Warren<\/strong>, B.L. Bhuva, T.D. Haeffner, and L.W. Massengill, \u201dA Radiation-Tolerant D Flip-Flop Designed for Low-Voltage Applications,\u201d 2019 GOMACTech Conference, San Diego, CA. Mar. 2019.<\/li>\n<li>J. Adams, R.A. Reed, B.D. Sierawski, Z. Robinson, J. Fisher, J. Nonnast, <strong>K.M. Warren<\/strong>, \u201cSpace Ionizing Radiation Environment and Effects (SIRE2) Model for Satellite Design,\u201d 42<sup>nd<\/sup> COSPAR Scientific Assembly, Pasadena, CA. 2018.<\/li>\n<li>R.A. Austin, B.D. Sierawski, R.A. Reed, J.M. Trippe, <strong>K.M. Warren<\/strong>, A.L. Sternberg, R.A. Weller, A.F. Witulski, \u201cMitigation of Single-Event Effects in CubeSat Commercial Off-the-Shelf Components,\u201d 2018 GOMACTech Conference, Miami, FL. Mar. 2018.<\/li>\n<li>B.D. Sierawski, R.A. Reed, <strong>K.M. Warren<\/strong>, A.L. Sternberg, R.A. Austin, J.M, Trippe, R.A. Weller, M.L. Alles, R.D. Schrimpf, L.W. Massengill, D.M. Fleetwood, G.W. Buxton, J.C. Brandenburg, W.B. Fisher, R. Davis, \u201cCubeSat: Real-time soft error measurements at low earth orbits,\u201d 2017 IEEE International Reliability Physics Symposium (IRPS).<\/li>\n<li>R.A. Austin, B.D. Sierawski, J.M. Trippe, A.L. Sternberg, <strong>K.M. Warren<\/strong>, R.A. Reed, R.A. Weller, R.D. Schrimpf, M.L. Alles, L.W. Massengill, D.M. Fleetwood, G.W. Buxton, J.C. Brandenburg, W. Burns Fisher, R. Davis, \u201cRadFxSat: A Flight Campaign for Recording Single-Event Effects in Commercial Off-the-Shelf Microelectronics,\u201dProceedings of the 2017 17<sup>th<\/sup> European Conference on Radiation and Its Effects on Components and Systems (RADECS), Oct. 2017.<\/li>\n<li>J.M. Trippe, R. A. Reed, B. D. Sierawski, R. A. Weller, R. A. Austin, L. W. Massengill, B. L. Bhuva, <strong>K.M. Warren<\/strong>, and B. Narasimham, \u201cPredicting the vulnerability of memories to muon-induced SEUs with low-energy proton test informed by Monte Carlo simulations\u201d 2016 IEEE International Reliability Physics Symposium (IRPS). Pasadena, CA, 2016, pp. SE-6-1-SE-6-6.<\/li>\n<li>M.A. Clemens, B.D. Sierawski, <strong>K.M. Warren<\/strong>, M.H. Mendenhall, R.A. Weller, R.A. Reed, and R.C. Baumann, &#8220;Cross Comparison of SEU and MCU Responses of a 65nm SRAM to 14 MeV and Terrestrial Neutrons,&#8221; Single Event Effects Symposium, 2012.<\/li>\n<li>M.L. Alles, R.D. Schrimpf, R.A. Reed, L.W. Massengill, R.A. Weller, M.H. Mendenhall, D.R. Ball, <strong>K.M. Warren<\/strong>, T.D. Loveless, J.S. Kauppila, and B.D. Sierawski, &#8220;Radiation Hardness of FDSOI and FinFET Technologies,&#8221; 2011 IEEE International SOI Conference, Tempe, AZ. pp. 1-2. Oct. 2011.<\/li>\n<li>B.D. Sierawski,<strong> K.M. Warren<\/strong>, R.A. Reed, R.A. Weller, M.H. Mendenhall, R.D. Schrimpf, R.C. Baumann, and V. Zhu , \u201cContribution of Low-Energy (&lt; 10 MeV) Neutrons to Upset Rate in a 65 nm SRAM,\u201d 2010 IEEE International Reliability Physics Symposium, Anaheim, CA. May 2010. pp. 395-399.<\/li>\n<li>V.B. Sheshadri, B.L. Bhuva, R.A. Reed, R.A. Weller, M.H. Mendenhall, R.D. Schrimpf,<strong> K.M. Warren<\/strong>, B.D. Sierawski, S. Wen, and R. Wong, \u201cEffects of Multi-node Charge Collection in Flip-flop Designs at Advanced Technology Nodes,\u201d IEEE International Reliability Physics Symposium, Anaheim, CA. pp. 1026-1030. May 2010.<\/li>\n<li><strong>K.M. Warren<\/strong>, R.A. Reed, R.A. Weller, M.H. Mendenhall, B.D. Sierawski, and R.D. Schrimpf, \u201cApplications of Monte Carlo Radiation Transport Simulations Techniques for Predicting Single Event Effects in Microelectronics,\u201d 21st International Conference on the Application of Accelerators in Research and Industry, Ft. Worth, TX. 2010.<\/li>\n<li><strong>K.M. Warren<\/strong>, C. Slayman and J. Wilkinson, \u201cMechanisms, Modeling, Measurement and Mitigation of Soft Errors,\u201d IEEE International Reliability Physics Symposium Short Course, Anaheim CA. 2010.<\/li>\n<li><strong>K.M. Warren<\/strong>, R.A. Reed, A. Sternberg, R.A. Weller, L.W. Massengill, R.D. Schrimpf, and M. Baze, \u201cSingle Event Upset Rate Prediction Methods for Circuit-level Hardened Devices,\u201d Single Event Effects Symposium, San Diego, CA. 2010.<\/li>\n<li>R.D. Schrimpf, <strong>K.M. Warren<\/strong>, R.A. Weller, R.A. Reed, L.W. Massengill, M.L. Alles, D.M. Fleetwood, X.J. Zhou, L. Tsetseris, and S.T. Pantelides, \u201cReliability and Radiation Effects in IC Technologies,\u201d IEEE International Reliability Physics Symposium, Phoenix, AZ. 2008. pp. 97-106.<\/li>\n<li>M. Porter, J. Wilkinson, K. Walsh, B. Sierawski, and <strong>K.M. Warren<\/strong>, \u201cSoft Rrror Reliability Improvements for Implantable Medical Devices, \u201c IEEE International Reliability Physics Symposium, Phoenix, AZ. pp. 488-491. 2008.<\/li>\n<li><strong>K.M. Warren<\/strong>, B.D. Sierawski, R. A. Reed, M. E. Porter, M. H. Mendenhall, R. D. Schrimpf, and L. W. Massengill, \u201cPredicting Neutron Induced Soft Error Rates: Evaluation of Accelerated Ground Based Test Methods,\u201d IEEE International Reliability and Physics Symposium, Phoenix, AZ.<\/li>\n<li>M. Turowski, A. Fedoseyev, A. Raman, <strong>K.M. Warren<\/strong>, and M.L. Alles, \u201cMixed- Mode Modeling of Radiation Effects with Nuclear Reactions in Nanoscale Electronics , \u201c GOMAC Conference, Las Vegas, NV. 2008.<\/li>\n<li>B.Hughlock, M. Baze, and<strong> K. Warren<\/strong>, \u201cRHBD Sequential Logic SEU Error Rates in Space Are Limited by Ions Incident at Grazing Angles,\u201d GOMAC Conference, Las Vegas, NV. 2008.<\/li>\n<li>R.D. Schrimpf, <strong>K.M. Warren<\/strong>, D.R. Ball, R.A. Weller, R.A. Reed, D.M. Fleetwood, L.W. Massengill, M.H. Mendenhall, S.N. Rashkeev, and S.T. Pantelides, &#8220;Multiscale Simulation of Radiation Effects in Electronic Devices,&#8221; European Conference on Radiation and Its Effects on Circuits and Systems Short Course Notes, Deauville, France, Sept. 10-14, 2007.<\/li>\n<li>J.D. Wilkinson, M. Porter, S. Morrison, R.A. Reed, B.D. Sierawski, <strong>K.M. Warren<\/strong>, R.A. Weller, and M.H. Mendenhall, &#8220;Ion Microprobe Measurements of Sensitive Volumes in a 0.25um CMOS Flip-flop,&#8221; IEEE Workshop on Silicon Errors in Logic-System Effects, Austin, TX. 2007.<\/li>\n<li><strong>K.M. Warren<\/strong>, J.D. Wilkinson, S. Morrison, R.A. Weller, M.E. Porter, and B.D. Sierawski, \u201cModeling Alpha and Neutron Induced Soft Errors in Static Random Access Memories\u201d, ICICDT Conference, Albuquerque, NM. 2007.<\/li>\n<li>N.F. Haddad, T. Bach, T. Conway, D. Lawson, J. Ross, J. Rodgers, A. Tipton, D. Ball, <strong>K. Warren<\/strong>, and R.D. Schrimpf, &#8220;Eliminating Low LET Sensitivities in Deep Sub-Micrometer SRAM Through Non-intrusive Technology Features,&#8221; Single Event Effects Symposium, 2006.<\/li>\n<li>N.F. Haddad, T. Bach, T. Conway, D. Lawson, J. Ross, J. Rodgers, A. Tipton, D Ball, <strong>K. Warren<\/strong> and R. Schrimpf, \u201cEliminating Low LET Sensitivities in Deep Sub-Micrometer SRAM through Non-intrusive Technology Features, \u201d Presented at RADECS, Athens, Greece. 2006.<\/li>\n<\/ul>\n<h1>Presentations<\/h1>\n<ul>\n<li>K.M. Warren, \u201cUsing CubeSats to Evaluate Radiation Effects on Advanced Electronics,\u201d 2018 Symposium on Space Innovations, Atlanta, GA. Nov. 2018.<\/li>\n<li>K.M. Warren, \u201cMonte Carlo Based Single-Event Effect and Soft-Error Rate Prediction Methods,\u201d Short Course Tutorial, 2012 Nuclear and Space Radiation Effects Conference. Miami, FL. July 2012.<\/li>\n<li>K.M. Warren, et al., \u201cApplications of Monte Carlo Radiation Transport Simulations Techniques for Predicting Single Event Effects in Microelectronics,\u201d 21st International Conference on the Application of Accelerators in Research and Industry, 2010.<\/li>\n<li>K.M. Warren, et al., \u201cMechanisms, Modeling, Measurement and Mitigation of Soft Errors,\u201d 2010 International Reliability and Physics Symposium Short Course Tutorial. May 2010.<\/li>\n<li>K.M. Warren, et al., \u201cHeavy Ion Testing and Single Event Upset Rate Prediction Considerations for a DICE Flip-Flop<em>,\u201d <\/em>2009 Nuclear and Space Radiation Effects Conference<em>.<\/em><\/li>\n<li>K.M. Warren, et al., \u201cPredicting Neutron Induced Soft Error Rates: Evaluation of Accelerated Ground Based Test Methods,\u201d Technical Presentation, 2008 International Reliability and Physics Symposium. April 2008.<\/li>\n<li>K.M. Warren, et al., \u201cIntegrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry,\u201d 2008 Nuclear and Space Radiation Effects Conference.<\/li>\n<li>K.M. Warren, et al., &#8220;Monte-Carlo Based On- Orbit Single Event Upset Rate Prediction for a Radiation Hardened by Design Latch,&#8221; 2007 Nuclear and Space Radiation Effects Conference.<\/li>\n<li>K.M. Warren, et al., \u201cThe Contribution of Nuclear Reactions to Heavy Ion Single Event Upset Cross-section Measurements in a High-density SEU Hardened SRAM,\u201d 2005 Nuclear and Space Radiation Effects Conference<em>.<\/em><\/li>\n<li>K.M. Warren, et al. \u201cModeling Alpha and Neutron Induced Soft Errors in Static Random Access Memories\u201d, Technical Presentation, 2007 ICICDT Conference Presentation.<\/li>\n<li>K.M. Warren, et al., \u201cSingle Event Burnout of NPN Bipolar Junction Transistors in Hybrid DC\/DC Converters,\u201d 2002 Nuclear and Space Radiation Effects Conference.<\/li>\n<li>K.M. Warren, et al., \u201cAnalysis of the Influence of MOS Device Geometry on Predicted SEU Cross Sections.\u201d 1998 Nuclear and Space Radiation Effects Conference<em>.<\/em><\/li>\n<\/ul>\n<h1>Additional Professional Skills<\/h1>\n<ul>\n<li>Proficient in C, C++, Python, 8\/16-bit mC assembly and Scheme programming languages<\/li>\n<li>Familiar with OSX, Linux, and Windows operating system environments<\/li>\n<li>Extensive experience with Cadence circuit design and layout EDA tools, Synopsys Sentaurus and Silvaco TCAD tools, and OrCad Schematic Capture and PCB design tools<\/li>\n<\/ul>\n<h1>Consulting<\/h1>\n<ul>\n<li>2015: With Mintz-Levine; expert witness on RF down\/up-converters<\/li>\n<li>2013-2014: With Covington &amp; Burling; expert witness on RF switch design<\/li>\n<li>2010: With Covington &amp; Burling; expert witness on semiconductor processing<\/li>\n<\/ul>\n<h1>Personal Background and Interests<\/h1>\n<ul>\n<li>U.S. Citizen<\/li>\n<li>ASEL\/AMEL Commercial Instrument Pilot<\/li>\n<li>Licensed Amateur Extra Class amateur radio operator, AK4TX<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Education Ph.D. Electrical Engineering, Vanderbilt University, Nashville, TN. 2010 Dissertation Title: Sensitive Volume Models For Single Event Upset Analysis and Rate Prediction for Space, Atmospheric, and Terrestrial Radiation Environments M.S. Electrical Engineering, Vanderbilt University, Nashville, TN. 1999 Thesis Title: The Influence of SOI-MOSFET Geometry on Predicted Single Event Cross Sections M.S. Chemistry, Vanderbilt University, Nashville,&#8230;<\/p>\n","protected":false},"author":8442,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"tags":[],"class_list":["post-3","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/my.vanderbilt.edu\/warrenkm\/wp-json\/wp\/v2\/pages\/3","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/my.vanderbilt.edu\/warrenkm\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/my.vanderbilt.edu\/warrenkm\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/my.vanderbilt.edu\/warrenkm\/wp-json\/wp\/v2\/users\/8442"}],"replies":[{"embeddable":true,"href":"https:\/\/my.vanderbilt.edu\/warrenkm\/wp-json\/wp\/v2\/comments?post=3"}],"version-history":[{"count":2,"href":"https:\/\/my.vanderbilt.edu\/warrenkm\/wp-json\/wp\/v2\/pages\/3\/revisions"}],"predecessor-version":[{"id":11,"href":"https:\/\/my.vanderbilt.edu\/warrenkm\/wp-json\/wp\/v2\/pages\/3\/revisions\/11"}],"wp:attachment":[{"href":"https:\/\/my.vanderbilt.edu\/warrenkm\/wp-json\/wp\/v2\/media?parent=3"}],"wp:term":[{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/my.vanderbilt.edu\/warrenkm\/wp-json\/wp\/v2\/tags?post=3"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}