Did you know? VINSE Helios G3X FIB-SEM
Did you know that the VINSE Helios FIB-SEM can create a nanosized sample from nearly any bulk material? Guided by the SEM, the focused ion beam can mill micron to nanoscale sections of glass, ceramics, semiconductors, metals and even vitrified cells and bacteria. Use these sections to gain sub-nm structural information with VINSE’s Osiris TEM-STEM.