REGISTER NOW: Atomic Force Microscopy (AFM)
AFM is an advanced multi-parametric imaging technique. It delivers very high-resolution 3D images of the topography of the sample. It also enables the characterization of the nano-mechanical, nano-electrical, and nano-magnetic properties of the surface. Users will learn about the theory of AFM as well as practical applications, operational tips for many of the various AFM techniques. This course covers applications of the Bruker Dimension Icon AFM for imaging in liquids to access scientifically and technologically interesting solid–liquid interfaces including biological samples. The applications will include biomolecular and biophysical measurements such as force spectroscopy and stiffness measurements. Students will learn about and use many of the ever-growing suite of AFM modes. Various case studies will be explained including those of considerable current interest such as semiconductors, 2D materials, and biomaterials. Several of the case studies will demonstrate how the use of multiple AFM modes can provide a better understanding of materials at the nanoscale than using just one mode alone. Sample preparation techniques and choosing appropriate AFM probes will be demonstrated. The course will also demonstrate the nanomanipulation and nanolithography capabilities of the Dimension Icon, including “writing” techniques in either graphical point-and-click mode, or in a recipe-driven mode in air and liquid.
Time – June 13 & 14, 2024
Cost – $50 Vanderbilt Users; $50 External Academic and Non-Profit Users; $150 Industry and For-Profit Users
REGISTER FOR ATOMIC FORCE MICROSCOPY