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E. B. Pitt, E. J. Barth, Z. J. Diggins, N. Mahadevan, G. Karsai, B. D. Sierawski, R. A. Reed, R. D. Schrimpf, R. A. Weller, M. L. Alles, and A. F. Witulski, “Radiation response and adaptive control-based degradation mitigation of mems accelerometers in ionizing dose environments,” IEEE Sensors J., vol. 17, no. 4, pp. 1132–1143, Feb. 2017.[ bib | DOI ] |
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J. M. Trippe, R. A. Reed, B. D. Sierawski, R. A. Weller, R. A. Austin, L. W. Massengill, B. L. Bhuva, K. M. Warren, and B. Narasimham, “Predicting the vulnerability of memories to muon-induced seus with low-energy proton tests informed by monte carlo simulations,” in Proc. of the Int. Rel. Physics Symp., Apr. 2016, pp. SE–6–1–SE–6–6.[ bib | DOI ] |
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B. D. Sierawski, K. M. Warren, A. L. Sternberg, R. A. Austin, J. M. Trippe, M. W. McCurdy, R. A. Reed, R. A. Weller, M. L. Alles, R. D. Schrimpf, L. W. Massengill, D. M. Fleetwood, A. Monteiro, G. W. Buxton, J. C. Brandenburg, W. B. Fisher, and R. Davis, “Cubesats and crowd-sourced monitoring for single event effects hardness assurance,” IEEE Trans. Nucl. Sci., vol. PP, no. 99, pp. 1–1, 2016.[ bib | DOI ] |
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Z. J. Diggins, N. Mahadevan, E. B. Pitt, D. Herbison, R. M. Hood, G. Karsai, B. D. Sierawski, E. J. Barth, R. A. Reed, R. D. Schrimpf, R. A. Weller, M. L. Alles, and A. F. Witulski, “Bayesian inference modeling of total ionizing dose effects on system performance,” IEEE Trans. Nucl. Sci., vol. 62, no. 6, pp. 2517–2524, Dec. 2015.[ bib | DOI ] |
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J. M. Trippe, R. A. Reed, R. A. Austin, B. D. Sierawski, R. A. Weller, E. D. Funkhouser, M. P. King, B. Narasimham, B. Bartz, R. Baumann, J. Labello, J. Nichols, R. D. Schrimpf, and S. L. Weeden-Wright, “Electron-induced single event upsets in 28nm and 45nm bulk SRAMs,” IEEE Trans. Nucl. Sci., vol. 62, no. 6, pp. 2709–2716, Dec. 2015.[ bib | DOI ] |
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N. A. Dodds, M. J. Martinez, P. E. Dodd, M. R. Shaneyfelt, F. W. Sexton, J. D. Black, D. S. Lee, S. E. Swanson, B. L. Bhuva, K. M. Warren, R. A. Reed, J. Trippe, B. D. Sierawski, R. A. Weller, N. Mahatme, N. J. Gaspard, T. Assis, R. Austin, S. L. Weeden-Wright, L. W. Massengill, G. Swift, M. Wirthlin, M. Cannon, R. Liu, L. Chen, A. T. Kelly, P. W. Marshall, M. Trinczek, E. W. Blackmore, S. J. Wen, R. Wong, B. Narasimham, J. A. Pellish, and H. Puchner, “The contribution of low-energy protons to the total on-orbit SEU rate,” IEEE Trans. Nucl. Sci., vol. 62, no. 6, pp. 2440–2451, Dec. 2015, IEEE Nuclear and Space Radiation Effects Conference (NSREC) Outstanding Conference Paper Award.[ bib | DOI ] |
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S. L. Weeden-Wright, M. P. King, N. C. Hooten, W. G. Bennett, B. D. Sierawski, R. D. Schrimpf, R. A. Weller, R. A. Reed, M. H. Mendenhall, D. M. Fleetwood, M. L. Alles, and R. C. Baumann, “Effects of energy-deposition variability on soft error rate prediction,” IEEE Trans. Nucl. Sci., vol. 62, no. 5, pp. 2181–2186, Oct. 2015.[ bib | DOI ] |
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R. A. Reed, R. A. Weller, M. H. Mendenhall, D. M. Fleetwood, K. M. Warren, B. D. Sierawski, M. P. King, R. D. Schrimpf, and E. C. Auden, “Physical processes and applications of the monte carlo radiative energy deposition (MRED) code,” IEEE Trans. Nucl. Sci., vol. 62, no. 4, pp. 1441–1461, Aug. 2015.[ bib | DOI ] |
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Z. J. Diggins, N. Mahadevan, E. B. Pitt, D. Herbison, G. Karsai, B. D. Sierawski, E. J. Barth, R. A. Reed, R. D. Schrimpf, R. A. Weller, M. L. Alles, and A. Witulski, “System health awareness in total-ionizing dose environments,” IEEE Trans. Nucl. Sci., vol. 62, no. 4, pp. 1674–1681, Aug. 2015.[ bib | DOI ] |
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Z. J. Diggins, N. Mahadevan, D. Herbison, G. Karsai, B. D. Sierawski, E. J. Barth, E. B. Pitt, R. A. Reed, R. D. Schrimpf, R. A. Weller, M. L. Alles, and A. Witulski, “Total-ionizing-dose induced timing window violations in CMOS microcontrollers,” IEEE Trans. Nucl. Sci., vol. 61, no. 6, pp. 2979–2984, Dec. 2014.[ bib | DOI ] |
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J. H. Adams, R. A. Weller, R. A. Reed, B. D. Sierawski, and M. H. Mendenhall, “Model of radiation effects on electronics (MREE),” NASA Tech Briefs Magazine: Software Supplement, vol. 38, no. 9, p. 15, Sep. 2014.[ bib ] |
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B. D. Sierawski, B. Bhuva, R. Reed, N. Tam, B. Narasimham, K. Ishida, A. Hillier, M. Trinczek, E. Blackmore, S.-J. Wen, and R. Wong, “Bias dependence of muon-induced single event upsets in 28 nm static random access memories,” in Proc. of the Int. Rel. Physics Symp., Jun. 2014, pp. 2B.2.1–2B.2.5.[ bib | DOI ] |
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M. P. King, R. A. Reed, R. A. Weller, M. H. Mendenhall, R. D. Schrimpf, B. D. Sierawski, A. L. Sternberg, B. Narasimham, J. K. Wang, E. Pitta, B. Bartz, D. Reed, C. Monzel, R. C. Baumann, X. Deng, J. A. Pellish, M. D. Berg, C. M. Seidleck, E. C. Auden, S. L. Weeden-Wright, N. J. Gaspard, C. Zhang, and D. M. Fleetwood, “Electron-induced single-event upsets in static random access memory,” IEEE Trans. Nucl. Sci., vol. 60, no. 6, pp. 4122–4129, Dec. 2013, IEEE Nuclear and Space Radiation Effects Conference (NSREC) Outstanding Conference Paper Award, Outstanding Student Paper Award.[ bib | DOI ] |
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J. H. Adams, A. F. Barghouty, M. H. Mendenhall, R. A. Reed, B. D. Sierawski, K. M. Warren, J. W. Watts, and R. A. Weller, “CRÈME: The 2011 revision of the cosmic ray effects on micro-electronics code,” IEEE Trans. Nucl. Sci., vol. 59, no. 6, pp. 3141–3147, 2012.[ bib | DOI ] |
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F. El-Mamouni, E. X. Zhang, D. R. Ball, B. D. Sierawski, M. P. King, R. D. Schrimpf, R. A. Reed, M. L. Alles, D. M. Fleetwood, D. Linten, E. Simoen, and G. Vizkelethy, “Heavy-ion-induced current transients in bulk and SOI FinFETs,” IEEE Trans. Nucl. Sci., vol. 59, no. 6, pp. 2674–2681, 2012.[ bib | DOI ] |
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J. Chetia, B. D. Sierawski, A. L. Sternberg, A. A. Adeleke, B. L. Bhuva, and L. W. Massengill, “An efficient AVF estimation technique using circuit partitioning,” in Proc. of the Conf. on Rad. Effects. on Comp. and Sys., Sep. 2011, pp. 507–510.[ bib | DOI ] |
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R. Garcia, E. J. Daly, H. D. R. Evans, P. Nieminen, G. Santin, B. D. Sierawski, and M. H. Mendenhall, “Combined use of heavy ion and proton test data in the determination of a GaAs power MESFET critical charge and sensitive depth,” in Proc. of the Conf. on Rad. Effects. on Comp. and Sys., Sep. 2011, pp. 244–251.[ bib | DOI ] |
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——, “Calibration of the weighed sensitive volume model to heavy ion experimental data,” in Proc. of the Conf. on Rad. Effects. on Comp. and Sys., Sep. 2011, pp. 60–66.[ bib | DOI ] |
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B. D. Sierawski, R. A. Reed, M. H. Mendenhall, R. A. Weller, R. D. Schrimpf, S.-J. Wen, R. Wong, N. Tam, and R. C. Baumann, “Effects of scaling on muon-induced soft errors,” in Proc. of the Int. Rel. Physics Symp., Apr. 2011, pp. 3C.3.1 –3C.3.6, IEEE International Reliability Physics Symposium Best Student Talk Award.[ bib | DOI ] |
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M. A. Clemens, B. D. Sierawski, K. M. Warren, M. H. Mendenhall, N. A. Dodds, R. A. Weller, R. A. Reed, P. E. Dodd, M. R. Shaneyfelt, J. R. Schwank, S. A. Wender, and R. C. Baumann, “The effects of neutron energy and high-z materials on single event upsets and multiple cell upsets,” IEEE Trans. Nucl. Sci., vol. 58, no. 6, pp. 2591–2598, 2011.[ bib | DOI ] |
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M. L. Alles, R. D. Schrimpf, R. A. Reed, L. W. Massengill, R. A. Weller, M. H. Mendenhall, D. R. Ball, K. M. Warren, T. D. Loveless, J. S. Kauppila, and B. D. Sierawski, “Radiation hardness of FDSOI and FinFET technologies,” in Proc. of the SOI Conf., 2011, pp. 1–2.[ bib | DOI ] |
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K. Warren, R. Reed, R. Weller, M. Mendenhall, B. Sierawski, and R. Schrimpf, “Applications of monte carlo radiation transport simulation techniques for predicting single event effects in microelectronics,” AIP Conference Proceedings, vol. 1336, no. 1, pp. 643–648, 2011.[ bib | DOI ] |
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B. D. Sierawski, M. H. Mendenhall, R. A. Reed, M. A. Clemens, R. A. Weller, R. D. Schrimpf, E. W. Blackmore, M. Trinczek, B. Hitti, J. A. Pellish, R. C. Baumann, S.-J. Wen, R. Wong, and N. Tam, “Muon-induced single event upsets in deep-submicron technology,” IEEE Trans. Nucl. Sci., vol. 57, no. 6, pp. 3273–3278, Dec. 2010, IEEE Nuclear and Space Radiation Effects Conference (NSREC) Outstanding Conference Paper Award Nominee.[ bib | DOI ] |
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B. Narasimham, J. K. Wang, M. Buer, R. Gorti, K. Chandrasekharan, K. M. Warren, B. D. Sierawski, R. D. Schrimpf, R. A. Reed, and R. A. Weller, “Contribution of control logic upsets and multi-node charge collection to flip-flop SEU cross-section in 40-nm CMOS,” IEEE Trans. Nucl. Sci., vol. 57, no. 6, pp. 3176–3182, Dec. 2010.[ bib | DOI ] |
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A. Dasgupta, D. M. Fleetwood, R. A. Reed, R. W. Weller, M. H. Mendenhall, and B. D. Sierawski, “Dose enhancement and reduction in SiO2 and High-K MOS insulators,” IEEE Trans. Nucl. Sci., vol. 57, no. 6, pp. 3463–3469, Dec. 2010.[ bib | DOI ] |
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J. A. Pellish, M. A. Xapsos, K. A. LaBel, P. W. Marshall, D. F. Heidel, K. P. Rodbell, M. C. Hakey, P. E. Dodd, M. R. Shaneyfelt, J. R. Schwank, R. C. Baumann, X. Deng, A. Marshall, B. D. Sierawski, J. D. Black, R. A. Reed, R. D. Schrimpf, H. S. Kim, M. D. Berg, M. J. Campola, M. R. Friendlich, C. E. Perez, A. M. Phan, and C. M. Seidleck, “Heavy ion testing with iron at 1 GeV/amu,” IEEE Trans. Nucl. Sci., vol. 57, no. 5, pp. 2948–2954, Oct. 2010, RADECS Meritorius Paper.[ bib | DOI ] |
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R. A. Weller, M. H. Mendenhall, R. A.Reed, R. D. Schrimpf, K. M. Warren, B. D. Sierawski, and L. W. Massengill, “Monte carlo simulation of single event effects,” IEEE Trans. Nucl. Sci., vol. 57, no. 4, pp. 1726–1746, Aug. 2010.[ bib | DOI ] |
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B. D. Sierawski, K. M. Warren, R. A. Reed, R. A. Weller, M. H. Mendenhall, R. D. Schrimpf, R. C. Baumann, and V. Zhu, “Contribution of low-energy ( < 10 mev) neutrons to upset rate in a 65 nm SRAM,” in Proc. of the Int. Rel. Physics Symp., May 2010, pp. 395–399.[ bib | DOI ] |
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V. B. Sheshadri, B. L. Bhuva, R. A. Reed, R. A. Weller, M. H. Mendenhall, R. D. Schrimpf, K. M. Warren, B. D. Sierawski, S.-J. Wen, and R. Wong, “Effects of multi-node charge collection in flip-flop designs at advanced technology nodes,” in Proc. of the Int. Rel. Physics Symp., May 2010, pp. 1026–1030.[ bib | DOI ] |
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B. D. Sierawski, J. A. Pellish, R. A. Reed, R. D. Schrimpf, R. A. Weller, M. H. Mendenhall, J. D. Black, A. D. Tipton, M. A. Xapsos, R. C. Baumann, X. Deng, M. R. Friendlich, H. S. Kim, A. M. Phan, and C. M. Seidleck, “Impact of low-energy proton induced upsets on test methods and rate predictions,” IEEE Trans. Nucl. Sci., vol. 56, no. 6, pp. 3085–3092, Dec. 2009, IEEE Nuclear and Space Radiation Effects Conference (NSREC) Outstanding Conference Paper Award Nominee.[ bib | DOI ] |
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R. A. Weller, R. A. Reed, K. M. Warren, M. H. Mendenhall, B. D. Sierawski, R. D. Schrimpf, and L. W. Massengill, “General framework for single event effects rate prediction in microelectronics,” IEEE Trans. Nucl. Sci., vol. 56, no. 6, pp. 3098–3108, Dec. 2009.[ bib | DOI ] |
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J. A. Pellish, M. A. Xapsos, K. A. LaBel, P. W. Marshall, D. F. Heidel, K. P. Rodbell, M. C. Hakey, P. E. Dodd, M. R. Shaneyfelt, J. R. Schwank, R. C. Baumann, X. Deng, A. Marshall, B. D. Sierawski, J. D. Black, R. A. Reed, R. D. Schrimpf, H. S. Kim, M. D. Berg, M. J. Campola, M. R. Friendlich, C. E. Perez, A. M. Phan, and C. M. Seidleck, “Heavy ion testing at the galactic cosmic ray energy peak,” in Proc. of the Conf. on Rad. Effects. on Comp. and Sys., Sep. 2009, pp. 559–562.[ bib | DOI ] |
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C. L. Howe, R. A. Weller, R. A. Reed, B. D. Sierawski, P. W. Marshall, C. J. Marshall, M. H. Mendenhall, R. D. Schrimpf, and J. E. Hubbs, “Effects of surrounding materials on proton-induced energy deposition in large silicon diode arrays,” IEEE Trans. Nucl. Sci., vol. 56, no. 4, pp. 2167–2170, Aug. 2009.[ bib | DOI ] |
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M. E. Porter, J. E. Wilkinson, K. Walsh, B. D. Sierawski, K. M. Warren, R. A. Reed, and G. Vizkelethy, “Soft error reliability improvements for implantable medical devices,” in Proc. of the Int. Rel. Physics Symp., Apr. 2008, pp. 488–491.[ bib | DOI ] |
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K. M. Warren, J. D. Wilkinson, R. A. Weller, B. D. Sierawski, R. A. Reed, M. E. Porter, M. H. Mendenhall, R. D. Schrimpf, and L. W. Massengill, “Predicting neutron induced soft error rates: Evaluation of accelerated ground based test methods,” in Proc. of the Int. Rel. Physics Symp., Apr. 2008, pp. 473–477.[ bib | DOI ] |
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C. L. Howe, R. A. Weller, R. A. Reed, B. D. Sierawski, P. W. Marshall, C. J. Marshall, M. H. Mendenhall, R. D. Schrimpf, and J. E. Hubbs, “Distribution of proton-induced transients in silicon focal plane arrays,” IEEE Trans. Nucl. Sci., vol. 54, no. 6, pp. 2444–2449, Dec. 2007.[ bib | DOI ] |
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J. A. Pellish, R. A. Reed, A. K. Sutton, R. A. Weller, M. A. Carts, P. W. Marshall, C. J. Marshall, R. Krithivasan, J. D. Cressler, M. H. Mendenhall, R. D. Schrimpf, K. M. Warren, B. D. Sierawski, and G. Niu, “A generalized SiGe HBT single-event effects model for on-orbit event rate calculations,” IEEE Trans. Nucl. Sci., vol. 54, no. 6, pp. 2322–2329, Dec. 2007.[ bib | DOI ] |
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R. A. Reed, R. A. Weller, M. H. Mendenhall, J.-M. Lauenstein, K. M. Warren, J. A. Pellish, R. D. Schrimpf, B. D. Sierawski, L. W. Massengill, P. E. Dodd, M. R. Shaneyfelt, J. A. Felix, J. Schwank, N. F. Haddad, R. K. Lawrence, J. H. Bowman, and R. Conde, “Impact of ion energy and species on single event effects analysis,” IEEE Trans. Nucl. Sci., vol. 54, no. 6, pp. 2312–2321, Dec. 2007.[ bib | DOI ] |
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K. M. Warren, B. D. Sierawski, R. A. Reed, R. A. Weller, C. Carmichael, J. D. Jong, A. Lesea, M. H. Mendenhall, R. D. Schrimpf, L. W. Massengill, T. Hoang, H. Wan, R. Padovani, and J. Fabula, “Monte-carlo based on-orbit single event upset rate prediction for a radiation hardened by design latch,” IEEE Trans. Nucl. Sci., vol. 54, no. 6, pp. 2419–2425, Dec. 2007.[ bib | DOI ] |
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R. A. Reed, G. Vizkelethy, J. A. Pellish, B. D. Sierawski, K. M. Warren, M. Porter, J. Wilinson, P. W. Marshall, G. Niu, J. D. Cressler, R. D. Schrimpf, A. Tipton, and R. A. Weller, “Applications of heavy ion microprobe for single event effects analysis,” Nucl. Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, vol. 261, pp. 443–446, Aug. 2007.[ bib | DOI ] |
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K. M. Warren, R. A. Weller, B. D. Sierawski, R. A. Reed, M. H. Mendenhall, R. D. Schrimpf, L. W. Massengill, M. E. Porter, J. D. Wilkerson, K. A. LaBel, and J. Adams, “Application of RADSAFE to model single event upset response of a 0.25um CMOS SRAM,” IEEE Trans. Nucl. Sci., vol. 54, no. 4, pp. 898–903, Aug. 2007.[ bib | DOI ] |
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K. M. Warren, B. D. Sierawski, R. A. Weller, R. A. Reed, M. H. Mendenhall, J. A. Pellish, R. D. Schrimpf, L. W. Massengill, M. E. Porter, and J. D. Wilkinson, “Predicting thermal neutron-induced soft errors in static memories using TCAD and physics-based monte carlo simulation tools,” IEEE Electron Device Lett., vol. 28, no. 2, pp. 180–182, Feb. 2007.[ bib | DOI ] |
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B. D. Sierawski, B. L. Bhuva, and L. W. Massengill, “Reducing soft error rate in logic circuits through approximate logic functions,” IEEE Trans. Nucl. Sci., vol. 53, no. 6, pp. 3417–3421, Dec. 2006.[ bib | DOI ] |
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A. D. Tipton, J. A. Pellish, R. A. Reed, M. H. M. Ronald D. Schrimpf, Robert A. Weller, B. D. Sierawski, A. K. Sutton, G. E. R. M. Diestelhorst, J. D. Cressler, P. W. Marshall, and G. Vizkelethy, “Multiple-bit upset in a 130nm CMOS technology,” IEEE Trans. Nucl. Sci., vol. 53, no. 6, pp. 3259–3264, Dec. 2006.[ bib | DOI ] |
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F. A. Aloul, B. D. Sierawski, and K. A. Sakallah, “Satometer: How much have we searched?” IEEE Trans. Comput.-Aided Design Integr. Circuits Syst., vol. 22, no. 8, pp. 995–1004, Aug. 2003.[ bib | DOI ] |
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——, “Satometer: How much have we searched?” in Proc. of the Design Automation Conf. New York, NY: ACM Press, Jun. 2002, pp. 737–742.[ bib | DOI ] |
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——, “A tool for measuring progress of backtrack search solvers,” in Proc. of the Symp. on the Theory and Applications of Satisfiability Testing, May 2002, pp. 98–105.[ bib ] |