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Caldwell Nanophotonic Materials and Devices Lab

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Courtney Ragle studied Chemistry and Journalism as an undergraduate at Fort Lewis College in Colorado. After graduating, she took several years away from academia as a guide for various outdoor activities, then worked in pharmaceuticals for a while before returning to school at Vanderbilt University to pursue a PhD in Interdisciplinary Materials Science (IMS). In the IMS program, she is dedicated to strong-coupling projects investigating transitions from microcavities to two-dimensional materials for control over chemical reaction mechanisms and discovery of applicable reactions as a member of both Caldwell and Buchanan Laboratories.

Courtney Ragle studied Chemistry and Journalism as an undergraduate at Fort Lewis College in Colorado. After graduating, she took several years away from academia as a guide for various outdoor activities, then worked in pharmaceuticals for a while before returning to school at Vanderbilt University to pursue a PhD in Interdisciplinary Materials Science (IMS). In the IMS program, she is dedicated to strong-coupling projects investigating transitions from microcavities to two-dimensional materials for control over chemical reaction mechanisms and discovery of applicable reactions as a member of both Caldwell and Buchanan Laboratories.

Saurabh Dixit is a postdoctoral researcher working at Vanderbilt University in the domain of 2D thin films and metamaterials for their potential applications in integrated nanophotonic and optical devices.
Aditha Senarath started his Ph.D. in the Vanderbilt Interdisciplinary Materials Science program in the Fall of 2021 and became a member of the Caldwell Lab in the spring of 2022. His academic background includes completing an M.Sc. in Physics from Wright State University, Ohio, followed by his B.Sc., majoring in Physics from the University of Peradeniya, Sri Lanka. Aditha's current research focuses on characterizing defects in semiconductor materials and devices to enhance their radiation hardness and overall reliability.

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