Collaboration between Vanderbilt and startup Femtometrix leads to exclusive deal
An innovative wafer inspection tool developed by a team of Vanderbilt professors and engineers has been licensed exclusively to startup company Femtometrix. The semiconductor wafer-inspection technology based on laser optics was invented by Norman Tolk, Ph.D., professor of physics, Michael Alles, engineer for Vanderbilt University’s School of Engineering, and Ron Schrimpf, Ph.D., professor of electrical engineering.