‘Ron Schrimpf’
Schrimpf receives IEEE Nuclear and Plasma Sciences Merit Award
Nov. 10, 2021—Ronald Schrimpf has received the 2021 IEEE Nuclear and Plasma Sciences Society Merit Award for contributions to the understanding of radiation effects in semiconductor devices and integrated circuits. The Merit Award is the highest technical award presented by the IEEE NPSS and the selection criteria include the importance of individual technical contributions as well as technical contributions made by teams...
Spotlight Publication: “3-D Full-Band Monte Carlo Simulation of Hot-Electron Energy Distributions in Gate-All-Around Si Nanowire MOSFETs” published in IEEE Transactions on Electron Devices
Oct. 22, 2021—“3-D Full-Band Monte Carlo Simulation of Hot-Electron Energy Distributions in Gate-All-Around Si Nanowire MOSFETs” published in IEEE Transactions on Electron Devices has been selected as a VINSE spotlight publication. About the author: Mahmud Reaz earned his Ph.D. in Interdisciplinary Materials Science in July 2021 under the supervision of Prof. Ronald D Schrimpf. Mahmud studied the fabrication,...
Collaboration between Vanderbilt and startup Femtometrix leads to exclusive deal
Jun. 27, 2013—An innovative wafer inspection tool developed by a team of Vanderbilt professors and engineers has been licensed exclusively to startup company Femtometrix. The semiconductor wafer-inspection technology based on laser optics was invented by Norman Tolk, Ph.D., professor of physics, Michael Alles, engineer for Vanderbilt University’s School of Engineering, and Ron Schrimpf, Ph.D., professor of electrical...