‘Norman Tolk’
Collaboration between Vanderbilt and startup Femtometrix leads to exclusive deal
Jun. 27, 2013—An innovative wafer inspection tool developed by a team of Vanderbilt professors and engineers has been licensed exclusively to startup company Femtometrix. The semiconductor wafer-inspection technology based on laser optics was invented by Norman Tolk, Ph.D., professor of physics, Michael Alles, engineer for Vanderbilt University’s School of Engineering, and Ron Schrimpf, Ph.D., professor of electrical...
Radiation damage bigger problem in microelectronics than previously thought
Jul. 19, 2012—The amount of damage that radiation causes in electronic materials may be at least 10 times greater than previously thought. That is the surprising result of a new characterization method that uses a combination of lasers and acoustic waves to provide scientists with a capability tantamount to X-ray vision: It allows them to peer through...