“Density functional theory and microscopy – a combination tool for the design of new materials” Electronic Materials and Applications, Orlando, Florida, January 22 – 24, 2014.
“Probing Energy-Related Materials at the Atomic Scale using a Combination of Density Functional Theory and Scanning Transmission Electron Microscope” International Workshop on Materials, Innovation and Solutions for the Oil and Gas Industry, Petroleum Institute, Abu Dhabi, United Arab Emirates, November 26 – 27, 2013.
“Two-dimensional materials”, Plenary talk, 19th Panhellenic Conference on Solid State Physics and materials Science, Athens, Greece, September 22-25, 2013.
“Ferromagnetism in complex transition-metal-oxide structures”, Joint European Magnetism Symposia, August 25-30, 2013, Rhodes, Greece
“Probing complex interfacial phenomena using a combination of theory and microscopy”, Plenary talk, 14th International Conference on Intergranular and Interphase Boundaries in Materials 2013, June 23-28, 2013, Halkidiki, Greece.
“Atomic-scale modeling of device reliability- the defects that cause the trouble”,18th Conference of Insulating Films on Semiconductors, June 25-28, 20913, Cracow, Poland.
“Probing complex systems of density functional theory and scanning transmission electron microscopy”, Atomic structure of nanosystems from first-principles simulations and microscopy experiments, June 4-6, 2013, Helsinki, Finland.
“Oxygen vacancies in transition-metal oxides”, Fifth North America-Greece-Cyprus Workshop on Paramagnetic Materials, Limassol, Cyprus, May 22-26, 2013.
“Grain boundaries in graphene — theory and microscopy”, Materials Research Society Fall Meeting, Boston, MA December 26-30, 2012.
“Oxygen vacancies in transition-metal oxides- a significant degree of freedom”, Workshop on Transition Metal Oxides, October 2- 5, 2012, Mallorca, Spain.
“Probing graphene excitations with a combination of scanning transmission electron microscopy and density functional theory”, CECAM Workshop on Graphene, August 13 – 17, 2012, Bremen, Germany.
“Modeling device reliability – the defects that cause the trouble”, 5th SINANO Summer School, August 28- 31, 2012, Bertinoro (Forlì-Cesena), Italy.
“Device Degradation – The Defects that Cause the Trouble”, Plenary talk, International Conference on Extended Defects in Semiconductors, June 24-29, 2012, Thessaloniki, Greece.